X
    學術可視化工作室RC   登錄   提交文稿
學術英文編修

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

期刊標題檢索 J ELECTRON TEST 最新評論: Do people read this publication? (2023-11-08)


期刊名稱:   ISSN:   主題領域:   影響因子範圍: -
索引:   類別:   開放訪問:   排序方式:

[JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS]您好,您是該頁面的第 16953 位訪客。

期刊簡介
期刊名稱JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
LetPub Score
5.0
50 ratings
Rate

Reputation
6.2

Influence
3.6

Speed
6.9

期刊簡稱J ELECTRON TEST
ISSN0923-8174
E-ISSN1573-0727
h-index31
CiteScore
CiteScoreSJRSNIPCiteScore Rank
2.000.2710.518
Subject fieldQuartilesRankPercentile
Category: Engineering
Subcategory: Electrical and Electronic Engineering
Q3495 / 797

自引率 (2023-2024)18.20%自引率趨勢
掲載範囲
The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:
Testing of VLSI devices printed circuit boards, and electronic systems;
Testing of analog and digital electronic circuits;
Testing of microprocessors, memories, and signal processing devices;
Fault modeling;
Test generation;
Fault simulation;
Testability analysis;
Design for testability;
Synthesis for testability;
Built-in self-test;
Test specification;
Fault tolerance;
Formal verification of hardware;
Simulation for verification;
Design debugging;
AI methods and expert systems for test and diagnosis;
Automatic test equipment (ATE);
Test fixtures;
Electron Beam Test Systems;
Test programming;
Test data analysis;
Economics of testing;
Quality and reliability;
CAD Tools;
Testing of wafer-scale integration devices;
Testing of reliable systems;
Manufacturing yield and design for yield improvement;
Failure mode analysis and process improvement
官方網站https://www.springer.com/10836
在線稿件提交https://www.editorialmanager.com/jett
開放訪問No
出版商Springer US
主題領域工程技术
出版國/地區UNITED STATES
發行頻率隔月刊行
創刊年1990
每年文章數43每年文章數趨勢
黃金OA百分比9.56%
Web of Science 四分位
2023-2024
WOS Quartile: Q4

CategoryEditionJIF QuartileJIF RankingJIF Percentage
ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ4278/352
索引 (SCI or SCIE)Science Citation Index Expanded
鏈接到PubMed Central (PMC)https://www.ncbi.nlm.nih.gov/nlmcatalog?term=0923-8174%5BISSN%5D
平均審稿時間 *來自出版商的數據:
來自作者的數據: Slow, 6-12 Week(s)
競爭力 *來自作者的數據: Easy
參考鏈接
相關期刊 【JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS】CiteScore趨勢
自引率趨勢 每年文章數趨勢
作者評論
*所有的審稿過程指標,如接受率和審稿速度,僅限於用戶提交的稿件。因此,這些指標可能無法準確反映期刊的競爭力或速度。
  • 同一學科的期刊
  • CiteScore趨勢
  • 自引率趨勢
  • 每年文章數趨勢
  •  
    學科內的可信期刊 影響因子
    PROCEEDINGS OF THE IEEEH-index: 250

    CiteScore: 46.40
    IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCEH-index: 326

    CiteScore: 28.40
    IEEE TRANSACTIONS ON IMAGE PROCESSINGH-index: 242

    CiteScore: 20.90
    IEEE TRANSACTIONS ON FUZZY SYSTEMSH-index: 170

    CiteScore: 20.50
    IEEE SIGNAL PROCESSING MAGAZINEH-index: 155

    CiteScore: 27.20
    IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERINGH-index: 148

    CiteScore: 11.70
    IEEE Journal of Selected Topics in Signal ProcessingH-index: 93

    CiteScore: 19.00
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGYH-index: 154

    CiteScore: 13.80
    IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMSH-index: 112

    CiteScore: 14.80
    ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCEH-index: 86

    CiteScore: 9.60
    學科內最受檢索的期刊 頁面查看次數
    IEEE SENSORS JOURNAL1019017
    EXPERT SYSTEMS WITH APPLICATIONS990433
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT971621
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS780548
    ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE593950
    IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS568618
    PATTERN RECOGNITION545466
    MULTIMEDIA TOOLS AND APPLICATIONS524952
    IEEE TRANSACTIONS ON IMAGE PROCESSING508476
    IEEE SIGNAL PROCESSING LETTERS465995
  •  

    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
    明年預測:
    穩步上升 無變化 逐步下降  刷新
  •  

     
  •  

     


首頁    上一頁    1    下一頁    末頁  (頁
/1)
  [JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS] 的評論撰寫評論
作者: eeyes


領域: 计算机科学
審稿時間: 3.0 month(s)
結果: 修改後接受


撰寫評論

2023-11-08 17:07:49 評論於
Do people read this publication?
(0) 讚! | eeyes

首頁    上一頁    1    下一頁    末頁  (頁
/1)

開始撰寫 [JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS] 的評論:





Contact us

Contact us  

Your name*

Your email*

Your message*

Please fill in all fields and provide a valid email.

Security Code*