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IEEE Design & Test

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期刊簡介
期刊名稱IEEE Design & Test IEEE Design & Test
LetPub Score
6.2
50 ratings
Rate

Reputation
7.6

Influence
4.9

Speed
7.0

期刊簡稱IEEE DES TEST
ISSN2168-2356
h-index72
CiteScore
CiteScoreSJRSNIPCiteScore Rank
3.800.4890.757
Subject fieldQuartilesRankPercentile
Category: Engineering
Subcategory: Electrical and Electronic Engineering
Q2354 / 797
Category: Engineering
Subcategory: Hardware and Architecture
Q394 / 177
Category: Engineering
Subcategory: Software
Q3230 / 407

自引率 (2023-2024)0.00%自引率趨勢
掲載範囲
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
官方網站https://www.ieee.org/membership-catalog/productdetail/showProductDetailPage.html?product=PER311-EPC
在線稿件提交
開放訪問No
出版商IEEE Computer Society
主題領域COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
出版國/地區UNITED STATES
發行頻率
創刊年0
每年文章數59每年文章數趨勢
黃金OA百分比6.08%
Web of Science 四分位
2023-2024
WOS Quartile: Q3

CategoryEditionJIF QuartileJIF RankingJIF Percentage
COMPUTER SCIENCE, HARDWARE & ARCHITECTURESCIEQ342/59
ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3211/352
索引 (SCI or SCIE)Science Citation Index Expanded
鏈接到PubMed Central (PMC)https://www.ncbi.nlm.nih.gov/nlmcatalog?term=2168-2356%5BISSN%5D
平均審稿時間 *來自出版商的數據:
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競爭力 *來自作者的數據:
參考鏈接
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*所有的審稿過程指標,如接受率和審稿速度,僅限於用戶提交的稿件。因此,這些指標可能無法準確反映期刊的競爭力或速度。
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    IEEE Design & Test IEEE Design & Test
    明年預測:
    穩步上升 無變化 逐步下降  刷新
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